E. J. Fuller Et Al. , "Quantitative Kelvin probe force microscopy of current-carrying devices," Applied Physics Letters , vol.102, no.8, 2013
Fuller, E. J. Et Al. 2013. Quantitative Kelvin probe force microscopy of current-carrying devices. Applied Physics Letters , vol.102, no.8 .
Fuller, E. J., Pan, D., Corso, B. L., Gul, O. T., Gomez, J. R., & Collins, P. G., (2013). Quantitative Kelvin probe force microscopy of current-carrying devices. Applied Physics Letters , vol.102, no.8.
Fuller, Elliot Et Al. "Quantitative Kelvin probe force microscopy of current-carrying devices," Applied Physics Letters , vol.102, no.8, 2013
Fuller, Elliot J. Et Al. "Quantitative Kelvin probe force microscopy of current-carrying devices." Applied Physics Letters , vol.102, no.8, 2013
Fuller, E. J. Et Al. (2013) . "Quantitative Kelvin probe force microscopy of current-carrying devices." Applied Physics Letters , vol.102, no.8.
@article{article, author={Elliot J. Fuller Et Al. }, title={Quantitative Kelvin probe force microscopy of current-carrying devices}, journal={Applied Physics Letters}, year=2013}